成果報告書詳細
管理番号20140000000598
タイトル*平成25年度中間年報 新エネルギー技術研究開発 革新的太陽光発電技術研究開発 (革新型太陽電池国際研究拠点整備事業) 低倍率集光型薄膜フルスペクトル太陽電池の研究開発(フルスペクトルTCO)
公開日2014/12/27
報告書年度2013 - 2013
委託先名旭硝子株式会社
プロジェクト番号P07015
部署名新エネルギー部
和文要約
英文要約Title: NEDO Innovative PV Technology “Thin Film Full Spectrum Solar Cells with Low Concentration Ratios” Full Spectrum TCO (FY2008-2014) FY2013 Annual Report

Our final targets of FY2014 are developing TCO substrates with sheet resistance of less than 5 Ohm/sq. and energy transmittance +6% higher compared with the current one. For this purpose, we have designed anti-reflection coatings for air/glass interface and glass/TCO interface. By computer optimization, +5.2% improvement is estimated in case of the configuration as air/SiO2(85.9n)/Ta2O5(114.8)/SiO2(28.0)/Ta2O5(14.3)/glass/ Ta2O5(8.7)/SiO2(44.7)/Ta2O5(19.6)/SiO2(20.3)/TCO (Values between brackets describe film thickness. Unit is nm.). And by changing glass substrates from AN100 (non-alkaline glass by Asahi Glass) to B270 (special kind of soda-lime glass by Shcott), +5.8% improvement is estimated compared to the conventional configuration (AN100 without anti-reflection coatings). As the result of sample evaluation, we confirmed +6.0~6.2% improvement from the conventional configuration. Therefore, our target of FY2014 has been achieved. We will continue to supply the TCO substrates to members of Tokyo Institute of Technology group. During the evaluation, we found a problem of the conventional method of optical measurement (IM method). In case of the IM method, CH2I2 liquid is painted on the TCO surface to suppress the scattering. But the CH2I2 liquid itself absorbs the light of wavelength shorter than 400nm. Therefore, the optical properties in short wavelength region can’t be evaluated correctly. However, if IM method is not adopted (in other words, transmittance is measured with TCO substrate only), large measurement error exists because certain amount of light escaped from the side edge of glass substrates due to the large scattering at TCO surface. To solve this problem, we established a new setup of measuring transmittance of TCO substrates correctly. In the new setup, TCO substrates are placed inside the integral sphere, in order to capture the light escaped from the side edge of glass substrates. This new method can be a useful tool for measuring the optical properties of TCO substrates which have high haze value.
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