成果報告書詳細
管理番号20140000000697
タイトル*平成25年度中間年報 太陽エネルギー技術研究開発 太陽光発電システム次世代高性能技術の開発 極限シリコン結晶太陽電池の研究開発 (次世代ヘテロ接合シリコン結晶太陽電池の接合評価)
公開日2015/2/19
報告書年度2013 - 2013
委託先名国立大学法人岐阜大学
プロジェクト番号P07015
部署名新エネルギー部
和文要約
英文要約 Title: High Performance PV Generation System for the Future. R and D on Ultimate Wafer-based Si Solar Cells. (Research on multiscale evaluation of thin heterojunction film for next genertion high efficiency solar cell by conductive AFM ) (FY2010-FY2014) FY2013 Annual Report

In order to improve efficiency of a-Si/c-Si hetero-junction solar cell, it is important to realize high open circuit voltages in keeping with high short circuit currents. However high open circuit voltages of a-Si/c-Si hetero-junction flat surface solar cells are often reported, the short circuit currents are still low. So textured c-Si substrates are introduced to achieve higher short circuit currents, but the open circuit voltages are still lower than about 700mV. So we have detected a-Si/c-Si hetero-junction surface that is textured, and found obvious leak current parts localized at mountain ridges using by the photovoltaic microscopy system. In order to improve the performance of a-Si/c-Si hetero-junction using by a photovoltaic microscopy system for crystalline silicon solar cell, there were necessary to improve the sensitivity and to enlarge a measureable area. Therefore the sensitivity is reinforced up to a pico-ampere level. Moreover, a new concept is introduced to enlarge the measureable area by combination of a micro-PCD and the photovoltaic microscopy. The former can measure life-time of minority carrier and cover from several tens cm square to several mm square. We suppose that detected leak current parts localized at mountain ridges using by the photovoltaic microscopy system are relative to the life-time. Preliminary experiment showed obvious relativity between the leak current and the lie-time. In order to decrease leak current parts, a new method are created to check the leak current by selective oxidization of silicon. As the experimental result the new method has succeeded to decrease leak current parts selectively.
ダウンロード成果報告書データベース(ユーザ登録必須)から、ダウンロードしてください。

▲トップに戻る