成果報告書詳細
管理番号20150000000389
タイトル*平成26年度中間年報 次世代材料評価基盤技術開発 研究開発項目(2)有機薄膜太陽電池材料の評価基盤技術開発
公開日2016/4/1
報告書年度2014 - 2014
委託先名次世代化学材料評価技術研究組合
プロジェクト番号P10029
部署名電子・材料・ナノテクノロジー部
和文要約
英文要約Title : Development of basic evaluation technologies for future generation materials / R&D items [2] Development of basic evaluation technologies for materials used in the fabrication of organic thin film photovoltaic devices

The major target of this project is to develop evaluation technologies for chemical materials used in the fabrication of thin film organic photovoltaic (OPV) devices. “Standard organic thin film solar cells and devices” are required to establish standard evaluation technologies. A standard device is defined as a standard solar cell with encapsulation. The mid-term target of this project until the end of the FY2015 is to complete the formation of standard cells. In addition to the standard devices on glass substrates we will develop devices on flexible film substrates. The candidate structures of typical OPV standard devices are categorized into a bulk hetero-junction type, a vacuum evaporation type and a perovskite type.
In the FY2014, we have developed highly efficient standard devices on glass substrates, which are three kinds of bulk heterojunction type with photoconversion efficiency over 5%, one kind of vacuum evaporation type with photoconversion efficiency of 7-8% and two kinds of perovskite type.
We have established a lifetime testing technology for the evaluation of water vapor and oxygen transmission rates under 1 sun light exposure by using the P3HT:ICBA bulk-heterojunction type standard device developed in the last year. The development of accelerated lifetime prediction method is now in progress.
In order to investigate flexible substrates, we have developed technologies for the fabrication of photovoltaic devices on flexible substrates at low temperatures (less than 130℃) and characterized their stability by measuring water vapor and oxygen transmission rates.
We have established several evaluation technologies and conducted trials to characterize the photovoltaic performance and reliability of OPV devices under indoor installation toward international standardization of the evaluation method (TC113).
We have measured work-functions of typical materials by using ultraviolet photoemission spectroscopy system and confirmed their validity. As additional equipment, a low energy inverse photoelectron spectroscopy system for the measurement of unoccupied levels and an X-ray photoelectron spectroscopy system for the measurement of Fermi-level, etc. were introduced.
By using femto- and micro-second transient absorption spectroscopy, transient photo-voltage spectroscopy and photo-current spectroscopy, we have found that the light-induced degradation of a P3HT:ICBA bulk heterojunction type standard device is mainly caused by trapping of photogenerated charge carriers.
Moreover, we have found that the degradation analysis by using thermal stimulated current (TSC) spectroscopy indicates the occurrence of thermal detrapping when the device was recovered by annealing after degradation by light exposure.
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