成果報告書詳細
管理番号20170000000083
タイトル*平成27年度中間年報 高性能・高信頼性太陽光発電の発電コスト低減技術開発 先端複合技術型シリコン太陽電池、高性能CIS太陽電池の技術開発 低コスト高効率セル及び高信頼性モジュールの実用化技術開発
公開日2017/3/31
報告書年度2015 - 2015
委託先名京セラ株式会社
プロジェクト番号P15003
部署名新エネルギー部
和文要約
英文要約Title: "Development of high performance and reliable PV modules to reduce levelized cost of energy/ The technology development of advanced composite silicon solar cells, high-performance CIS solar cells/ Practical technology development of low-cost high-efficiency cell and high reliable module " (FY2015 to FY2017) FY2015 annual report. Kyocera Corporation.

We perform the inspection and maintenance of the thermal chamber, large size thermal shock equipment, and temperature/humidity chamber. To achieve 22% in cell efficiency on our original P-type PERC cells, device simulation was implemented for the power loss analysis. The test result showed that the largest factor for the loss was found on front side passivation film and doping layer on front side. Device simulation indicated that the improvement on the passivation quality and higher sheet resistance on the doping layer on front side would increase the cell voltage value, Voc. The result of short loop test showed that SiN/AlOx passivation film-coating at 120 ohms / sq sheet resistance would allow the cell to achieve 680mV.The 2nd largest factor for the loss was the rear side passivation film. The 3rd largest factor was the front side doping area under the metallization.(c) To solve the issue, we started to working with the material supplier on high-sheet-resistance, low-damage paste. Using SiN/AlOx coat for front side passivation film, good contact resistance was observed, and we are now evaluating the electrical characteristics. Development of high-quality Si-crystallized solar cell produced with high-quality mass production process (for 35year product life).In 2015, among high temperature and humidity stress test (TCT), UV stress test, and high voltage test (with hypothetical PID), we analyzed the high temp/humidity test sample to find out the power degradation mechanism (created degradation simulation). We also analyzed the solar modules from the field. On the high temperature and humidity test noted above, we did quantitative analysis on liquid, acetic acid and lead (Pb) contained in the sealant material of a solar module. Acetic acid dramatically increased in an exponential manner, and Pb increased roughly in proportion to Acetic acid quantity. From the above result, we made a hypothesis that acetic acid was generated under high temperature and humidity environment, and it attack against glass layer between metallization and Si and made it corrosion. This phenomenon caused the degradation. Based on this hypothesis, we made simulation model for glass corrosion, high temperature and humidity stress. On the other side, some modules were corrected from outfield in several sites of Japan, and they were analyzed for acetic acid and Pb. The quantity of acetic acid is wide variation depending on module design such as material, structure, process condition in production. And as for Pb quantity is in proportion to acetic acid one. After we compared quantity of acetic acid between field modules and simulation using sample modules accelerated test, we found out the two manners of field modules. One is acetic acid increased more than simulation value significantly. It might be caused by ultraviolet rays. Then we are intended to make simulation model added with ultraviolet rays continuously. The other case was that acetic acid went outside through back sheet. We also make simulation with this case. Regarding stress test, evaluation and analysis, we started investigate with AIST. In 2015, we carried out unit test to understand manner of degradation caused by stress of high temperature and humidity, thermal cycle, environment under high voltage and grasped these manners. In 2016, we will be intended to carry out combination test with above condition including ultraviolet stress.
ダウンロード成果報告書データベース(ユーザ登録必須)から、ダウンロードしてください。

▲トップに戻る