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成果報告書詳細
管理番号20160000000163
タイトル*平成27年度中間年報 固体酸化物形燃料電池等実用化推進技術開発 固体酸化物形燃料電池の耐久性迅速評価方法に関する基礎研究
公開日2017/4/15
報告書年度2015 - 2015
委託先名国立研究開発法人産業技術総合研究所 一般財団法人電力中央研究所 TOTO株式会社 日本特殊陶業株式会社 日本ガイシ株式会社 株式会社村田製作所 国立大学法人九州大学 国立大学法人京都大学 国立大学法人東北大学 国立大学法人東京大学
プロジェクト番号P13001
部署名新エネルギー部
和文要約
英文要約Title: Technology development for SOFC commercialization promotion. Basic study on rapid evaluation method of SOFC durability (FY2013-FY2017) FY2015 Annual Report

Durability tests were made several times on six different stacks in the first, second and third groups; in addition, preparation was made for Denso stacks which joined this project November, 2015. MPHS stacks exhibited excellent cell performance for long period of time such as 20,000 h. Detailed analyses on such cell materials revealed that the presence of chromium containing vapors does not lead to severe degradation; only a small amount of chromium comes into the B-site of perovskite lattice and makes the A-site deficient; this enhances diffusivity leading to some sintering of cathodes, although corresponding cathode degradation is small. Those Kyocera cells which were operated in real service environments exhibit excellent durability and this is confirmed from the detailed analyses on impurity accumulation inside cathodes; that is, accumulation of Cr decreases with fabrication year and that the technology of hindering Cr vaporization becomes well improved. Accumulated amounts of sulfur in cathode increase with time, but there is no indication that such sulfur deposition leads to degradation of cell performance. CRIEPI tests of durability on TOTO, NGK INSULATORS, NGK SPARK PLUG, and Murata exhibited curious behaviors; generally speaking, the degradation rate observed in CRIEPI’s site are much higher than those made in respective sites or Tokyo gas site. Since contamination of sulfur into air was suggested, several points were improved in CRIEPI. Effects of such improvements will be examined carefully. AIST measured impurities in those cell materials and revealed that chromium level is quite low for all cells, whereas some stacks were heavily contaminated with sulfur. In order to extract possible factors of governing those degradation behaviors, several new insights were applied on the basis of observed cell-stack degradation behaviors. The first attempt was made to plot the cathode overpotential values against the ohmic loss. When degradation was large, points moved rapidly in the plot, whereas highly durable cells do not move because both contributions kept essentially the same value. Even so, interesting correlations were observed in such a plot and may help to identify the degradation mechanisms. The second approach is to consider the difference in microstructure of doped ceria interlayer derived from detailed FIB-SEM analyses by Univ. Kyoto. Some stacks were fabricated into dense interlayer whereas the rest allowed to be porous. Such difference well corresponds to cathode behaviors when sulfur contamination becomes severe, although detailed mechanism is not clarified yet. The third approach must be considerations on complicated effects of impurities particularly in cathodes.
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