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成果報告書詳細
管理番号20170000000740
タイトル*平成28年度中間年報 高性能・高信頼性太陽光発電の発電コスト低減技術開発 先端複合技術型シリコン太陽電池、高性能CIS太陽電池の技術開発 低コスト高効率セル及び高信頼性モジュールの実用化技術開発
公開日2017/8/29
報告書年度2016 - 2016
委託先名京セラ株式会社
プロジェクト番号P15003
部署名新エネルギー部
和文要約
英文要約Title: "Development of high performance and reliable PV modules to reduce levelized cost of energy/ The technology development of advanced composite silicon solar cells, high-performance CIS solar cells/ Practical technology development of low-cost high-efficiency cell and high reliable module" (FY2016 to FY2018) FY2017 annual report. Kyocera Corporation. To achieve the generation cost of 14yen/kWh by 2020 and 7yen/kWh by 2030, we need to develop high performance and reliable silicon PV modules with low cost and high quality mass production process. In the development of the high performance silicon PV modules with low cost mass production process, we achieved 20.6% efficiency with the mono-crystalline solar cell and 20.0% efficiency with the multi-crystalline solar cell by optimizing PERC solar cell technology. Also we developed high quality multi-crystalline casting process by seed-cast method. We achieved 20.19% efficiency with the PERC solar cell by the seed-cast method. Furthermore, we performed device simulation for power loss analysis of the 20.19% efficiency solar cell and found rooms for improvement of the recombination loss at the passivated surfaces and the electrodes on both of front and rear side. We are intended to achieve 21% efficiency as an interim target, by improving emitter and reducing recombination velocity at the rear surface. In the development of the high reliable silicon PV modules with high quality mass production process, we conducted degradation study and product life evaluation by performing UV / dump heat / thermal cycle / high voltage (PID) stress tests and analyzing PV modules installed in the fields. Also we started to study long life material / structure of the PV module. For these study we prepared the UV / dump heat combined stress test chamber. In the study of UV / dump heat stress we found the criteria to meet more than 35 years product life based on degradation mechanism by acetic acid. We confirmed that the life varied depending on the module design and its life matched the prediction based on our analysis. In the study of thermal cycle stress we found the criteria to meet more than 35 years product life by performing mechanical analysis focused on the stresses occurred at the copper / solder / silver electrode joint area and applying Coffin-Manson law. In the study of PID stress we focused on the shunt resistance value of p-n junction and found that the shunt resistance would be saturated at certain level, and the saturation level largely depended on the module design. Then, we found the criteria to minimize shunt resistance deterioration. In the development of the long life PV module we started reliability tests of EVA substitution material and double-glass PV module. As the collaboration research with FREA we performed a part of the above stress tests and analysis and now we are performing combined stress test and long life PV module evaluation test.
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